iPhone power button quality
Question
Assume you are reporting on Apple's hardware quality and you are tasked with understanding the time to failure for the new iPhone's power button. You worked with a team to run a paired t-test with 1,000 new iPhones and 1,000 iPhones from the previous generation.
The results of your test show that the new iPhone's power button's mean time to failure is 50% lower than the last generation's iPhone, with a p-value of 0.02. How would you describe the experiment and the result to a non-technical stakeholder?